We also develop a new word - level fault parallel fs algorithin for synchronous sequential circuits 接著又開發(fā)了一個新的單機(jī)字級故障并行fs算法。
The content of this thesis just is parallel atpg algorithlms and it prototype system for non - scan synchionous sequential circuits 本文的研究內(nèi)容正是面向非掃描同步時序電路的并行atpg算法。
Most of vlsi circuits are sequential circuits . sequential circuits can be simulated by symbolic finite state machine ( fsm ) Vlsi系統(tǒng)中大部分是時序電路,時序電路可以用符號化的有限狀態(tài)機(jī)( finite - state - machine ,簡稱fsm )來模擬。
Although some scholars have done lots of work on the test generation of the digital circuits , it is still a well - known puzzle to test sequential circuits 雖然各國學(xué)者在數(shù)字電路測試生成上已做了大量的工作,時序電路的測試生成仍然是公認(rèn)的難題。
The sy - stem had different requirements on time sequence in high - speed clock and low - speed clock situations , which resulted in the complexity of the sequential circuit 在高速時鐘和低速時鐘的情況下,系統(tǒng)有不同的時序要求,這就決定了時序電路的復(fù)雜性。
The international standard sequential circuits iscas ' 89 ( addendum ' 93 included ) is used to verify the algorithm , and the results are better than other algorithms " 采用國際標(biāo)準(zhǔn)時序電路iscas ’ 89 (包括addendum ’ 93 )進(jìn)行了算法驗(yàn)證,取得了優(yōu)于文獻(xiàn)中其它算法的結(jié)果。